New trim configurations for laser trimmed thick-film resistors-theoretical analysis, numerical simulation and experimental verification

Microelectronics Reliability

Volumn 45, Issue 12, 2005, Pages 1941-1948

  Wroński, Marek ^a   Kamiński, Sławomir ^b   Miś, Edward ^b   Dziedzic, Andrzej ^b  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

^b WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; LASER THEORY; PULSE WIDTH MODULATION; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; STRUCTURAL DESIGN; THICK FILMS;

LASER TRIMMING; PULSE DURABILITY; THICK-FILM RESISTORS;

RESISTORS;

EID: 27744599282     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.03.006     Document Type: Conference Paper

References (11)

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