Thermal expansion of the Ti5Si3 and Ti 6Si2B phases investigated by high-temperature X-ray diffraction

Intermetallics

Volumn 14, Issue 3, 2006, Pages 236-240

  Rodrigues, Geovani ^a   Nunes, Carlos Angelo ^a   Suzuki, Paulo Atsushi ^a   Coelho, Gilberto Carvalho ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

A. Silicides, various; A. Ternary alloy system; B. Anisotropy; B. Thermal properties; F. Diffraction

Indexed keywords

ANISOTROPY; ARGON; CRYSTALLIZATION; HEAT TREATMENT; HIGH TEMPERATURE ENGINEERING; LATTICE CONSTANTS; TERNARY SYSTEMS; THERMAL EXPANSION; X RAY DIFFRACTION;

PHASE CRYSTALLIZATION; SILICIDES; TERNARY ALLOY SYSTEMS; THERMAL EXPANSION COEFFICIENTS;

TITANIUM ALLOYS;

EID: 27744589223     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.intermet.2005.05.007     Document Type: Article

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