메뉴 건너뛰기




Volumn 12, Issue 4, 2005, Pages 655-668

Model for electrical tree initiation in epoxy resin

Author keywords

Aging; Charge carrier processes; Electric breakdown; Electroluminescence; Percolation

Indexed keywords

CHARGE CARRIER PROCESS; CHARGE RECOMBINATION; ELECTRICAL TREE INITIATION;

EID: 27744586663     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2005.1511091     Document Type: Article
Times cited : (57)

References (20)
  • 1
    • 0036693407 scopus 로고    scopus 로고
    • Understanding electrical trees in solids: From experiment to theory
    • L.A. Dissado, "Understanding Electrical Trees in Solids: From Experiment to Theory", IEEE Trans. Dielectr. Electr. Insul., Vol. 4, pp. 483-497, 2002.
    • (2002) IEEE Trans. Dielectr. Electr. Insul. , vol.4 , pp. 483-497
    • Dissado, L.A.1
  • 3
    • 0001452289 scopus 로고    scopus 로고
    • Electrical trees:Physical mechanisms and experimental techniques
    • Ed. J. g. Webster (J. Wiley and Sons, USA. ISBN 0-471-13946-7)
    • S. Bamji, "Electrical Trees:Physical Mechanisms and Experimental Techniques" in Encyclopedia of Electrical and Electronics Engineering, Ed. J. g. Webster (J. Wiley and Sons, USA. ISBN 0-471-13946-7), Vol. 6, pp. 264-275, 1999.
    • (1999) Encyclopedia of Electrical and Electronics Engineering , vol.6 , pp. 264-275
    • Bamji, S.1
  • 4
    • 0027591829 scopus 로고
    • Quantitative measurement of light emission during the early stages of electrical breakdown in epoxy and unsaturated polyester resins
    • J.V. Champion, S.J. Dodd, and G.C. Stevens, "Quantitative Measurement of light Emission During the Early Stages of Electrical Breakdown in Epoxy and Unsaturated Polyester Resins", J. Phys. D: Appl. Phys., Vol. 26, pp. 819-828, 1993.
    • (1993) J. Phys. D: Appl. Phys. , vol.26 , pp. 819-828
    • Champion, J.V.1    Dodd, S.J.2    Stevens, G.C.3
  • 5
    • 0033098982 scopus 로고    scopus 로고
    • Optical pre-breakdown warnings in insulating polymers
    • C.Laurent "Optical Pre-Breakdown Warnings in Insulating Polymers", IEEE Electr. Insul. Mag., Vol. 15, No. 2, pp. 5-13, 1999.
    • (1999) IEEE Electr. Insul. Mag. , vol.15 , Issue.2 , pp. 5-13
    • Laurent, C.1
  • 6
    • 0028392820 scopus 로고
    • Long term light emission measurements and imaging during the early stages of electrical breakdown in epoxy resin
    • J. V.Champion, S. J.Dodd, and G.C. Stevens, "Long Term Light Emission Measurements and Imaging During the Early Stages of Electrical Breakdown in Epoxy Resin", J. Phys. D: Appl. Phys., Vol.27, pp. 604-610, 1994.
    • (1994) J. Phys. D: Appl. Phys. , vol.27 , pp. 604-610
    • Champion, J.V.1    Dodd, S.J.2    Stevens, G.C.3
  • 7
    • 0001421935 scopus 로고
    • Dynamic bipolar charge recombination model for electroluminescence in polymer based insulation during electrical tree initiation
    • J.M. Alison, J.V. Champion, S.J. Dodd, and G.S. Stevens, "Dynamic Bipolar Charge Recombination Model for Electroluminescence in Polymer Based Insulation During Electrical Tree Initiation", J. Phys. D: Appl. Phys., Vol.28, pp. 1693-1701, 1995.
    • (1995) J. Phys. D: Appl. Phys. , vol.28 , pp. 1693-1701
    • Alison, J.M.1    Champion, J.V.2    Dodd, S.J.3    Stevens, G.S.4
  • 9
    • 0032492040 scopus 로고    scopus 로고
    • Analysis of the luminescence decay following excitation of polyethylene naphthalate films by an electric field
    • G. Tesseydre, D. Mary, C. Laurent, "Analysis of the luminescence decay following excitation of polyethylene naphthalate films by an electric field", J. Phys. D: Appl. Phys., Vol. 31, pp. 267-275, 1998.
    • (1998) J. Phys. D: Appl. Phys. , vol.31 , pp. 267-275
    • Tesseydre, G.1    Mary, D.2    Laurent, C.3
  • 10
    • 0042934167 scopus 로고    scopus 로고
    • Electronic transport in disordered n-alkanes: From fluid methane to amorphous polyethylene
    • D. Cubero, N. Quirke, and D.F. Coker,"Electronic transport in disordered n-alkanes: From fluid methane to amorphous polyethylene", J. Chem. Phys., Vol. 119, pp. 2669-2679, 2003.
    • (2003) J. Chem. Phys. , vol.119 , pp. 2669-2679
    • Cubero, D.1    Quirke, N.2    Coker, D.F.3
  • 11
    • 0035827986 scopus 로고    scopus 로고
    • Molecular modelling of electron traps in polymer insulators: Chemical defects and impurities
    • M. Meunier, N. Quike,. A. Aslanides, "Molecular modelling of electron traps in polymer insulators: Chemical defects and impurities", J. Chem. Phys., Vol. 115, pp. 2876-2881, 2001.
    • (2001) J. Chem. Phys. , vol.115 , pp. 2876-2881
    • Meunier, M.1    Quike, N.2    Aslanides, A.3
  • 12
    • 0003440109 scopus 로고
    • P.Peregrinus London for IEE, IEE materials and Devices Series 9, Ed. G.C.Stevens, (ISBN 0 86341 1967)
    • L.A. Dissado and J.C. Fothergill, Electrical Degradation and breakdown in Polymers, P.Peregrinus London for IEE, IEE materials and Devices Series 9, Ed. G.C.Stevens, (ISBN 0 86341 1967) 1992.
    • (1992) Electrical Degradation and Breakdown in Polymers
    • Dissado, L.A.1    Fothergill, J.C.2
  • 14
    • 0002302384 scopus 로고    scopus 로고
    • The micro-physics of charge in solid dielectrics
    • edited by J. C. Fothergill and L. A. Dissado, The Dielectrics Society
    • T. J. Lewis, "The micro-physics of charge in solid dielectrics", in Space charge in solid dielectrics edited by J. C. Fothergill and L. A. Dissado, The Dielectrics Society, pp. 1-17, 1998.
    • (1998) Space Charge in Solid Dielectrics , pp. 1-17
    • Lewis, T.J.1
  • 15
    • 10844296580 scopus 로고    scopus 로고
    • Percolation model for electrical breakdown in insulating polymers
    • K. Wu and L. A. Dissado, and T.Okamoto, "Percolation Model for Electrical Breakdown in Insulating Polymers", Appl. Phys. Lett., Vol.85, pp. 4454-4456, 2004.
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 4454-4456
    • Wu, K.1    Dissado, L.A.2    Okamoto, T.3
  • 16
    • 0035193495 scopus 로고    scopus 로고
    • Initiation mechanism of electrical tree under alternating stress - Electron impact or UV photo-degradation?
    • (Eindhoven The Netherlands), (IEEE Pub.01CH3711)
    • N. Shimizu, T. Takahashi, and S. Iemurua, "Initiation Mechanism of Electrical Tree under Alternating Stress - Electron Impact or UV Photo-Degradation?", Proc. 7th IEEE ICSD, (Eindhoven The Netherlands), (IEEE Pub.01CH3711), pp. 423-426, 2001.
    • (2001) Proc. 7th IEEE ICSD , pp. 423-426
    • Shimizu, N.1    Takahashi, T.2    Iemurua, S.3
  • 20
    • 0032289239 scopus 로고    scopus 로고
    • Direct observation of polyethylene microstructures under field and temperature conditions, before any degradation
    • (Vasteros Sweden), (IEEE Pub.98CH36132)
    • C.Bertin, J.Guastavino, M.Briot, A.Campus, P.Druot, "Direct Observation of Polyethylene microstructures under Field and Temperature Conditions, before any degradation", Proc. 6th IEEE ICSD, (Vasteros Sweden), (IEEE Pub.98CH36132), pp. 265-268, 1998.
    • (1998) Proc. 6th IEEE ICSD , pp. 265-268
    • Bertin, C.1    Guastavino, J.2    Briot, M.3    Campus, A.4    Druot, P.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.