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Volumn 115, Issue 6, 2001, Pages 2876-2881
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Molecular modeling of electron traps in polymer insulators: Chemical defects and impurities
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER MOBILITY;
CONFORMATIONS;
DEFECTS;
DIELECTRIC PROPERTIES;
ELECTRIC BREAKDOWN;
ELECTRIC CABLES;
ELECTRIC INSULATION;
IMPURITIES;
MOLECULAR DYNAMICS;
MOLECULAR STRUCTURE;
POLYETHYLENES;
PROBABILITY DENSITY FUNCTION;
CHEMICAL DEFECTS;
HIGH-VOLTAGE ELECTRIC CABLES;
MOLECULAR ELECTRON AFFINITY;
MOLECULAR MODELING;
ELECTRON TRAPS;
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EID: 0035827986
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1385160 Document Type: Article |
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Times cited : (385)
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References (30)
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