Hardness, yield strength, and dislocation velocity in elemental and compound semiconductors

Materials Transactions

Volumn 46, Issue 9, 2005, Pages 1979-1985

  Yonenaga, Ichiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Dislocations; Hardness; Semiconductors; Velocity; Wide band gap; Yield strength

Indexed keywords

DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; MICROHARDNESS; PLASTIC DEFORMATION; STRAIN RATE; SUPERPLASTICITY; TENSILE STRESS; VELOCITY MEASUREMENT; YIELD STRESS;

MACROSCOPIC PLASTICITY; WIDE-BAND-GAPS;

SEMICONDUCTOR MATERIALS;

EID: 27744555639     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.46.1979     Document Type: Article

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