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Volumn 94, Issue 23, 2005, Pages
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Imaging spin flows in semiconductors subject to electric, magnetic, and strain fields
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Author keywords
[No Author keywords available]
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Indexed keywords
SCANNING KERR MICROSCOPY;
STRAIN FIELDS;
ELECTRIC FIELD EFFECTS;
MAGNETIC FIELD EFFECTS;
MICROSCOPIC EXAMINATION;
STRAIN;
STRESSES;
TENSORS;
SEMICONDUCTOR MATERIALS;
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EID: 27744526212
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.94.236601 Document Type: Article |
Times cited : (175)
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References (17)
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