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Volumn 94, Issue 23, 2005, Pages

Imaging spin flows in semiconductors subject to electric, magnetic, and strain fields

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING KERR MICROSCOPY; STRAIN FIELDS;

EID: 27744526212     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.236601     Document Type: Article
Times cited : (175)

References (17)
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