TOF-SIMS, A new versatile technique for the analysis of environmental aerosols?

Journal of Aerosol Science

Volumn 31, Issue SUPPL.1, 2000, Pages

  Van Ham, R ^a   Adriaens, A ^a   Van Vaeck, L ^a   Adams, F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Instrument Evaluation; Molecular speciation; Particle characterisation; Time of flight secondary ion mass spectrometry (TOF SIMS)

Indexed keywords

AIR POLLUTION; ION BEAMS; PARTICLE SIZE ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SILICON WAFERS;

MOLECULAR SPECIATION;

ATMOSPHERIC AEROSOLS;

EID: 0034271005     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0021-8502(00)90407-5     Document Type: Review

References (1)

1. Prati, P., P. Putti, A. Zucchiatti, F. Lucarelli and P.A. Mando (1999). Study of particulate emissions near a steel plant in Geneva by continuous sampling and PIXE hourly analysis, Nucl. Instr. and Meth. B 150, 428.