Integrated-optic variable delay line and its application to a low-coherence reflectometer

Optics Letters

Volumn 30, Issue 20, 2005, Pages 2739-2741

  Takiguchi, K ^a   Itoh, M ^a   Takahashi, H ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT-WAVE CIRCUIT TECHNOLOGY; LOW-COHERENCE REFLECTOMETER; REFLECTOMETER SENSITIVITY;

NETWORKS (CIRCUITS); OPTICAL SWITCHES; REFLECTOMETERS; SENSITIVITY ANALYSIS;

INTEGRATED OPTICS;

EID: 27744517919     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.002739     Document Type: Article

References (11)

1. T. Bosselmann and R. Ulrich, in OFS '84-International Conference on Optical Fiber Sensors, Proceedings (VDE-VERLAG GmbH, 1984), p. 361.
2. S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
3. V. Morgner, W. Drexler, F. X. KÄrtner, X. D. Li, C. Pitris, E. P. Ippen, and J. G. Fujimoto, Opt. Lett. 25, 111 (2000).
4. G. J. Tearney, B. E. Bouma, and J. G. Fujimoto, Opt. Lett. 23, 1811 (1997).
5. P. G. Sinha and T. Yoshino, J. Lightwave Technol. 16, 2010 (1998).
6. T. Miya, IEEE J. Sel. Top. Quantum Electron. 6, 38 (2000).
7. K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
8. K. Takiguchi, in Proc. SPIE 5623, 325 (2005).
9. Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
10. N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
11. S. Kawakami, Appl. Opt. 22, 2426 (1983).