Numerical modeling and electromagnetic resonant modes in complex grating structures and optoelectronic device applications

IEEE Transactions on Electron Devices

Volumn 52, Issue 11, 2005, Pages 2365-2373

  Crouse, David ^a  

^a City University of New York   (United States)

Author keywords

Diffraction; Metal semiconductor metal (MSM) devices; Optoelectronic devices; Photodetectors; Plasmons; Semiconductor metal interfaces; Surface plasmon (SP); Surface waves

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; DIELECTRIC MATERIALS; DIFFRACTION GRATINGS; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PHOTODETECTORS; SEMICONDUCTOR DEVICE STRUCTURES; SURFACE PLASMON RESONANCE; SURFACE WAVES;

METAL-SEMICONDUCTOR-METAL (MSM) DEVICES; SEMICONDUCTOR METAL INTERFACES; WOOD-RAYLEIGH ANOMALIES;

OPTOELECTRONIC DEVICES;

EID: 27744487422     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.857172     Document Type: Article

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