Electron and ion sheath effects on a microwave "hairpin" probe

Applied Physics Letters

Volumn 87, Issue 20, 2005, Pages 1-3

  Haas, F A ^a   Al Kuzee, J ^a   Braithwaite, N St J ^a  

^a OPEN UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; MATHEMATICAL MODELS; PERMITTIVITY; PLASMA SHEATHS; RESONANCE;

ELECTRON SHEATH; ION SHEATH; LOW-PRESSURE PLASMAS; QUARTER-WAVELENGTH STANDING WAVES;

MICROWAVES;

EID: 27744484334     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2131196     Document Type: Article

References (4)

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3. R. B. Piejak, V. A. Godyak, R. Garner, and B. M. Alexandrovich, J. Appl. Phys. 95, 3785 (2004).
4. R. B. Piejak, J. Al-Kuzee, and N. St. J. Braithwaite, Plasma Sources Sci. Technol. 14, 734 (2005).