Silicide formation study at the interface of Zr/Si system using high-energy swift heavy ion

Radiation Measurements

Volumn 40, Issue 2-6, 2005, Pages 762-764

  Sisodia, Veenu ^a   Bolse, Wolfgang ^c   Avasthi, D K ^b   Kabiraj, D ^b   Jain, I P ^a  

^a UNIVERSITY OF RAJASTHAN   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Interface; Irradiation; Swift heavy ions

Indexed keywords

HEAVY IONS; INTERFACES (MATERIALS); MIXING; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; X RAY DIFFRACTION;

ELECTRONIC EXCITATION; PHASE FORMATION; SILICIDE; SWIFT HEAVY IONS;

SILICON COMPOUNDS;

EID: 27744459202     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2005.06.028     Document Type: Conference Paper

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