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Volumn , Issue , 2005, Pages 267-270

Ultra-fast LIGBTs and superjunction devices in membrane technology

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ETCHING; INTEGRATED CIRCUITS; SEMICONDUCTOR JUNCTIONS; SILICON ON INSULATOR TECHNOLOGY; SWITCHING;

EID: 27744455730     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (32)

References (9)
  • 1
    • 27744576115 scopus 로고    scopus 로고
    • US parent 6,703,684 (filed Sept 2000, granted)
    • F. Udrea and G. Amaratunga, US parent 6,703,684 (filed Sept 2000, granted 2004).
    • (2004)
    • Udrea, F.1    Amaratunga, G.2
  • 3
    • 21644477091 scopus 로고    scopus 로고
    • Membrane high voltage devices - A milestone concept in power ICs
    • F. Udrea, T Trajkovic and G. A. J. Amaratunga, "Membrane High Voltage Devices - A Milestone Concept in Power ICs", IEDM 2005, p451-454.
    • (2005) IEDM , pp. 451-454
    • Udrea, F.1    Trajkovic, T.2    Amaratunga, G.A.J.3
  • 4
    • 84867312234 scopus 로고
    • Prospects of high voltage power ICs on thin SOI
    • Nakagawa A. et al., "Prospects of High Voltage Power ICs on thin SOI", IEDM Tech Dig., p. 229, (1992).
    • (1992) IEDM Tech Dig. , pp. 229
    • Nakagawa, A.1
  • 5
    • 0026403124 scopus 로고
    • Realization of high breakdown voltage (>700 V) in thin SOI devices
    • Merchant S. et al., "Realization of high breakdown voltage (>700 V) in thin SOI devices", ISPSD'91 p.31, 1991
    • (1991) ISPSD'91 , pp. 31
    • Merchant, S.1
  • 8
    • 0031633245 scopus 로고    scopus 로고
    • Simulated performances of semiconductor superjunction devices
    • T. Fujihara and Y. Miyasaka, "Simulated Performances of Semiconductor Superjunction Devices", ISPSD98 p. 423
    • ISPSD98 , pp. 423
    • Fujihara, T.1    Miyasaka, Y.2
  • 9
    • 0032256942 scopus 로고    scopus 로고
    • A new generation of high Voltage MOSFETs breaks the limit of silicon
    • G. Deboy et al "A new generation of high Voltage MOSFETs breaks the limit of silicon", IEDM, p.683, 1998
    • (1998) IEDM , pp. 683
    • Deboy, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.