XPS and XMCD study of Fe3O4/GaAs interface

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 2808-2810

  Lu, Yongxiong ^a   Claydon, Jill S ^a   Ahmad, Ehsan ^a   Xu, Yongbing ^a   Thompson, Sarah M ^a   Wilson, Karen ^a   Van Der Laan, Gerrit ^b  

^a UNIVERSITY OF YORK   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Half metallic Fe3O4; Post growth oxidation; Spintronics; XMCD

Indexed keywords

ABSORPTION SPECTROSCOPY; GROWTH KINETICS; INTERFACES (MATERIALS); IRON OXIDES; MAGNETISM; OXIDATION; SEMICONDUCTING GALLIUM ARSENIDE; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

HALF-METALLIC FE2O3; POST-GROWTH OXIDATION; SPINTRONICS; X-RAY MAGNETIC CIRCULAR DICHROISM (XMCD);

IRON ALLOYS;

EID: 27744455309     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854834     Document Type: Article

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