Characterization of nano-oxide layers fabricated by ion beam oxidation

IEEE Transactions on Magnetics

Volumn 38, Issue 5 I, 2002, Pages 2755-2757

  Cardoso, Susana ^a,b   Zhang, Zongzhi ^a,b   Li, Haohua ^a,b   Ferreira, Ricardo ^a,b   Freitas, Paulo P ^a,b   Wei, Peng ^c   Soares, José C ^c,d   Snoeck, Etienne ^e   Batlle, Xavier ^f  

^a INESC   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^d UNIVERSITY OF LISBON   (Portugal)

^e CEMES CNRS   (France)

^f UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Ion oxidation; Nano oxide layers; Transmission electron microscopy; Tunnel junctions

Indexed keywords

ALUMINA; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); ION BEAMS; MAGNETIZATION; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL JUNCTIONS;

PLASMA OXIDATION;

MAGNETIC FILMS;

EID: 0036762598     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.802863     Document Type: Article

References (7)

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