High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths

Optics Letters

Volumn 30, Issue 20, 2005, Pages 2727-2729

  Chiang, Hai Pang ^a   Lin, Jing Lun ^a   Chang, Railing ^a   Su, Sheng Yu ^a   Tak Leung, Pui ^b  

^a NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^b PORTLAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-RESOLUTION ANGULAR MEASUREMENT; P-POLARIZED; REFLECTED WAVES; S-POLARIZED;

FUNCTIONS; LIGHT POLARIZATION; SURFACE PLASMON RESONANCE;

ANGLE MEASUREMENT;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; MOTION; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE;

ALGORITHMS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; INTERFEROMETRY; MOTION; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE;

EID: 27744452874     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.30.002727     Document Type: Article

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