Application of atomic force microscopy to the study of glass decay

Materials Characterization

Volumn 55, Issue 4-5, 2005, Pages 272-280

  Garcia Heras M ^a   Carmona, N ^b   Ruiz Conde, A ^c   Sanchez Soto P ^c   Benitez J J ^c  

^a DEPARTMENT OF PHYSICAL METALLURGY   (Spain)

^b FRAUNHOFER INSTITUTE FOR SILICATE RESEARCH ISC   (Germany)

^c CSIC   (Spain)

Author keywords

Chemical resistance; Decay; Glass; Microscopy; Weathering

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORROSION RESISTANCE; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; SCANNING ELECTRON MICROSCOPY;

CORRODED TEXTURE; ENERGY DISPERSIVE X-RAY SPECTROMETRY; GLASS DECAY;

WEATHERING;

EID: 27644598641     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2005.07.001     Document Type: Article

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