Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 370-377

  van der Pol, Jacob A ^a   Ooms, Eric R ^a   van't Hof, Toon ^a   Kuper, Fred G ^a  

^a Waferfab AN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; RELIABILITY;

BUILT IN RELIABILITY (BIR) TECHNIQUES;

INTEGRATED CIRCUIT TESTING;

EID: 0031674382     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1998.670671     Document Type: Conference Paper

References (15)