Skin detection using pairwise models

Image and Vision Computing

Volumn 23, Issue 13, 2005, Pages 1122-1130

  Jedynak, Bruno ^a,c   Zheng, Huicheng ^b   Daoudi, Mohamed ^b  

^a UNIVERSITÉ LILLE 1   (France)

^b ECOLE CENTRALE DE LILLE   (France)

^c Johns Hopkins University   (United States)

Author keywords

Markov random field; Maximum entropy models; Skin detection

Indexed keywords

DATABASE SYSTEMS; DETECTORS; ENTROPY; IMAGE PROCESSING; MARKOV PROCESSES; MATHEMATICAL MODELS;

MARKOV RANDOM FIELD; MAXIMUM ENTROPY MODELS; PIXELS; SKIN DETECTION;

SKIN;

EID: 27644535854     PISSN: 02628856     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.imavis.2005.06.010     Document Type: Article

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