In situ measurement of capacitance: A method for fabricating nanoglass

Journal of the American Ceramic Society

Volumn 88, Issue 6, 2005, Pages 1634-1636

  Ohta, Y ^a   Kitayama, M ^a,d   Kaneko, K ^b   Toh, S ^b   Shimizu, F ^c   Morinaga, K ^b  

^a FUKUOKA INSTITUTE OF TECHNOLOGY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

^c Shoei Chemical Inc   (Japan)

^d AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITES; IN SITU MEASUREMENTS; NANOGLASS;

CAPACITANCE; FUSED SILICA; IN SITU PROCESSING; PARTICLE SIZE ANALYSIS; QUENCHING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

GLASS CERAMICS;

EID: 27644504905     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00257.x     Document Type: Article

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