Determination of absolute defect concentrations for saturated positron trapping - Deformed polycrystalline Ni as a case study

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 240, Issue 3, 2005, Pages 719-725

  Krause Rehberg, R ^a   Bondarenko, V ^a   Thiele, E ^b   Klemm, R ^b   Schell, N ^c  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Bragg diffraction profiles; Dislocation density; Nickel; Positron annihilation; Specific trapping rate; VEPAS

Indexed keywords

DECOMPOSITION; DIFFUSION; DISLOCATIONS (CRYSTALS); NICKEL; POSITRONS; SPECTROSCOPIC ANALYSIS; SYNCHROTRONS;

BRAGG-DIFFRACTION PROFILES; DISLOCATION DENSITY; POSITRON ANNIHILATION; SPECIFIC TRAPPING RATE; VEPAS;

POLYCRYSTALLINE MATERIALS;

EID: 27644457415     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.04.130     Document Type: Article

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