Optical properties of Er-doped Al2O3-SiO2 films prepared by a modified sol-gel process

Journal of the American Ceramic Society

Volumn 88, Issue 9, 2005, Pages 2380-2384

  Seok, Sang Il ^a   Lim, Mi Ae ^a   Ju, Jung Jin ^b   Lee, Myung Hyun ^b  

^a Korea Research Institute of Chemical Technology   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; DOPING (ADDITIVES); ELLIPSOMETRY; ERBIUM; MORPHOLOGY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PRECIPITATION (CHEMICAL); RADIATION; REFRACTIVE INDEX; SILICON WAFERS; SOL-GELS; SPIN COATING; X RAY DIFFRACTION;

CRACK FREE; MODIFIED SOL-GEL PROCESS; OXYGEN-PURGED FURNACES; PEAK INTENSITIES;

THIN FILMS;

EID: 27644440308     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00454.x     Document Type: Article

References (10)

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