Oxidised porous silicon/disperse red 1 composite material: Fabrication and micro-Raman spectrometry analysis

Physica Status Solidi C: Conferences

Volumn 2, Issue 9, 2005, Pages 3453-3456

  Guendouz, M ^a   Kloul, M ^b   Haesaert, S ^a   Joubert, P ^a   Bardeau, J F ^b   Bulou, A ^b  

^a CNRS   (France)

^b UNIVERSITÉ DU MAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITE MATERIALS; CONCENTRATION (PROCESS); DISPERSIONS; OXIDATION; POROSITY; RAMAN SPECTROSCOPY; REFLECTION;

MICRO-RAMAN SPECTROMETRY ANALYSIS; OPTICAL REFLECTIVITY; RAMAN SIGNALS; RELATIVE CONCENTRATION;

POROUS SILICON;

EID: 27344459134     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461218     Document Type: Conference Paper

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