Characteristic variation of superconducting thin films modified by an atomic force microscope

Physica Status Solidi C: Conferences

Volumn 2, Issue 5, 2005, Pages 1692-1696

  Kang, Hyeong Gon ^a   Ko, Seokcheol ^a   Jahng, Kwang Yeop ^a   Lee, Haeseong ^b  

^a Chonbuk National University   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; LITHOGRAPHY; OXIDATION; SCANNING; THIN FILMS;

FLUX CREEP; SUPERCONDUCTING FLUX;

SUPERCONDUCTIVITY;

EID: 27344455887     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200460813     Document Type: Article

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