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Volumn 2, Issue 7, 2005, Pages 2887-2890
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Surface roughness induced phase-separation in InGaN and LED applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROLUMINESCENCE;
PHASE SEPARATION;
PHOTOLUMINESCENCE;
SEMICONDUCTING INDIUM COMPOUNDS;
AFM;
INJECTION CURRENT;
SURFACE MOBILITY;
TRIMETHYL GALLIUM SOURCE;
LIGHT EMITTING DIODES;
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EID: 27344447253
PISSN: 16101634
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1002/pssc.200461440 Document Type: Conference Paper |
Times cited : (8)
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References (8)
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