Defect analysis of NiMnSb epitaxial layers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 240, Issue 1-2, 2005, Pages 356-359

  Nowicki, L ^a   Turos, A ^a,b   Stonert, A ^a   Garrido, F ^c   Molenkamp, L W ^d   Bach, P ^d   Schmidt, G ^d   Karczewski, G ^e   Mucklich A ^f  

^a SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^d UNIVERSITY OF WÜRZBURG   (Germany)

^e INSTITUTE OF PHYSICS   (Poland)

^f INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Half metals; Ion channeling; Molecular beam epitaxy; Spintronics; Structural defects

Indexed keywords

BACKSCATTERING; GRAIN BOUNDARIES; NICKEL COMPOUNDS; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

HALF-METALS; ION CHANNELING; SPINTRONICS; STRUCTURAL DEFECTS;

MOLECULAR BEAM EPITAXY;

EID: 27344445274     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.161     Document Type: Conference Paper

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