Structural and optical characterization of epitaxial layers of CdTe/PbTe grown on BaF2 (111) substrates

Physica Status Solidi C: Conferences

Volumn 2, Issue 3, 2005, Pages 1167-1171

  Dziawa, P ^a   Taliashvili, B ^a   Domuchowski, W ^a   Kowalczyk, L ^a   Lusakowska E ^a   Mycielski, A ^a   Osinniy, V ^a   Story, T ^a  

^a INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE DIFFRACTION; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING LEAD COMPOUNDS;

NEUTRAL ACCEPTORS; OPTICAL CHARACTERIZATION; PHOTOLUMINESCENCE SPECTRA; SPECTRAL RANGE;

EPITAXIAL GROWTH;

EID: 27344439484     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200460652     Document Type: Conference Paper

References (4)

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4. G. J. Hawkins et al., Infrares Physics & Technology 39, 297-306 (1998).