Statistical quality control of a multistep production process using total process yield

Quality Engineering

Volumn 11, Issue 2, 1998, Pages 187-195

  Graves, Spencer B ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

Chute yield; First pass yield; First time through acceptable quality; Global yield; Go through rate; Managing manufacturing engineering; Nonadjusted rate; Overall yield; Statistical process control (SPC); Straight through percent

Indexed keywords

EID: 27344434611     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1080/08982119808919229     Document Type: Article

References (13)

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