Control limits for multi-stage manufacturing processes with binomial yield (Single and multiple production runs)

Journal of the Operational Research Society

Volumn 47, Issue 1, 1996, Pages 98-112

  Barad, Miry Am ^a   Braha, Daniel ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Lot sizing; Multi stage processes; Stochastic yield

Indexed keywords

INVENTORY CONTROL; OPERATIONS RESEARCH; OPTIMAL CONTROL SYSTEMS; PROCESS CONTROL; RANDOM PROCESSES;

BINOMIAL YIELD; LOT SIZING; MULTISTAGE MANUFACTURING PROCESSES;

PRODUCTION CONTROL;

EID: 0029752323     PISSN: 01605682     EISSN: 14769360     Source Type: Journal    
DOI: 10.1057/jors.1996.9     Document Type: Article

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