Investigation of photorefractive SBN crystals with atomic force microscopy

Ferroelectrics

Volumn 296, Issue , 2003, Pages 19-27

  Soergel, E ^a   Pankrath, R ^b   Buse, K ^a  

^a UNIVERSITY OF BONN   (Germany)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

Photorefractive materials; Scanning force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CRYSTAL DEFECTS; CRYSTALS; DIELECTRIC MATERIALS; MAGNETIC DOMAINS; REFRACTIVE INDEX; SURFACE PROPERTIES;

ELECTROSTATIC FORCE DETECTION; LIGHT DIFFRACTION; PHOTOREFRACTIVE GRATING; SCANNING FORCE MICROSCOPY;

PHOTOREFRACTIVE MATERIALS;

EID: 27244442474     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390238865     Document Type: Conference Paper

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