Direct observation of charge gratings on photorefractive materials using force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3736, Issue , 1999, Pages 416-422

  Krieger, W ^a   Soergel, E ^a   Roesel, G ^a   Walther, H ^a  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; DIFFRACTION GRATINGS; ELECTRIC SPACE CHARGE; ELECTROSTATICS; NANOTECHNOLOGY; OPTICAL RESOLVING POWER; ORGANIC POLYMERS; PHOTOREFRACTIVE MATERIALS;

CHARGE DISTRIBUTION; CHARGE GRATINGS; ELECTROSTATIC FORCE DETECTION; PHOTOREFRACTIVE POLYMER FILMS;

ATOMIC FORCE MICROSCOPY;

EID: 0032664986     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)