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Volumn 21, Issue 2, 2005, Pages 144-150

Characterisation of PVD TiCN layers by physical and electrochemical methods

Author keywords

Electrochemical impedance spectroscopy; Hard coatings; X ray diffraction technique

Indexed keywords

CRYSTAL LATTICES; ELECTROCHEMISTRY; MAGNETRON SPUTTERING; METHANE; NITROGEN; PHYSICAL VAPOR DEPOSITION; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

EID: 27144553792     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/174329405X40876     Document Type: Article
Times cited : (10)

References (32)
  • 11
    • 27144554210 scopus 로고    scopus 로고
    • Characterization of PVDTiCN-layers with different chemical composition
    • Hanover, Germany
    • L. F. Senna, C. A. Achete, F. L. Freire Jr and T. Hirsch: 'Characterization of PVDTiCN-layers with different chemical composition', Final Report VW I 69021, Hanover, Germany, 1997.
    • (1997) Final Report , vol.VW I 69021
    • Senna, L.F.1    Achete, C.A.2    Freire Jr., F.L.3    Hirsch, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.