Comment on "Formation and atomic structures of double-layer steps on Si (100) surfaces studied by scanning tunneling microscope" by H.Q. Yang, C.X. Zhu, J.N. Gao, Z.Q. Xue, S.J. Pang [Surface Science 429 (1999) L481-L485]

Surface Science

Volumn 449, Issue 1-3, 2000, Pages

  Zandvliet, H J W ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Scanning tunneling microscopy; Silicon; Single crystal surfaces

Indexed keywords

EID: 27144462359     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00125-4     Document Type: Note

References (9)

1. H.Q. Yang, C.X. Zhu, J.N. Gao, Z.Q. Xue, S.J. Pang, Surf. Sei. 429 (1999) L481.
2. D. Dijkkamp, A.J. Hoeven, E.J. van Loenen, J.M. Lenssinck, J. Dieleman, Appl. Phys. Lett. 56 (1990) 39.
3. H.J.W. Zandvliet, H.B. Elswijk, Phys. Rev. B 48 (1993) 14269.
4. D.J. Chadi, Phys. Rev. Lett. 59 (1987) 1691.
5. O.L. Alerhand, A.N. Berker, J.D. Joannopoulos, D. Vanderbilt, R.J. Hamers, J.E. Demuth, Phys. Rev. Lett. 64 (1990) 2406.
6. H.J.W. Zandvliet, H.B. Elswijk, E.J. van Loenen, D. Dijkkamp, Phys. Rev. B 45 (1992) 5965.
7. N.C. Bartelt, T.L. Einstein, C. Rottman, Phys. Rev. Lett. 66 (1991) 961.
8. E. Pehlke, J. Tersoff, Phys. Rev. Lett. 67 (1991) 465.
9. H.J.W. Zandvliet, S. van Dijken, B. Poelsema, Phys. Rev. B 53 (1996) 15429.