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Volumn 59, Issue 28, 2005, Pages 3539-3542

Study on the growth, etch morphology and spectra of Y2SiO 5 crystal

Author keywords

Czochralski method; Dislocation; Low angle boundary; Spectral properties; Y2SiO5 crystal

Indexed keywords

ADSORPTION; DISLOCATIONS (CRYSTALS); DISSOCIATION; ETCHING; GRAIN BOUNDARIES; SINGLE CRYSTALS; YTTRIUM COMPOUNDS;

EID: 27144459001     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.06.036     Document Type: Article
Times cited : (17)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.