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Volumn 59, Issue 28, 2005, Pages 3539-3542
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Study on the growth, etch morphology and spectra of Y2SiO 5 crystal
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Author keywords
Czochralski method; Dislocation; Low angle boundary; Spectral properties; Y2SiO5 crystal
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Indexed keywords
ADSORPTION;
DISLOCATIONS (CRYSTALS);
DISSOCIATION;
ETCHING;
GRAIN BOUNDARIES;
SINGLE CRYSTALS;
YTTRIUM COMPOUNDS;
DISLOCATION;
LOW-ANGLE PROPERTIES;
SPECTRAL PROPERTIES;
Y2SIO5 CRYSTAL;
CRYSTAL GROWTH FROM MELT;
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EID: 27144459001
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2005.06.036 Document Type: Article |
Times cited : (17)
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References (12)
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