Linear and non-linear model for statistical localization of landmarks

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 4, 2002, Pages 393-396

  Romaniuk, B ^a   Desvignes, M ^a   Revenu, M ^a   Deshayes, M J ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NONLINEAR SYSTEMS; ERROR ANALYSIS; IMAGE ANALYSIS; MATHEMATICAL MODELS; STATISTICAL METHODS;

KERNEL PCA; LINEAR METHODS; MEAN ERRORS; NON-LINEAR MODEL; REAL APPLICATIONS; RIGID REGISTRATION; SPATIAL RELATIONSHIPS; STATISTICAL APPROACH;

PATTERN RECOGNITION;

LINEAR MODELS; NON LINEAR MODELS;

EID: 26944503693     PISSN: 10514651     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICPR.2002.1047478     Document Type: Article

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