Swapped interconnection networks: Topological, performance, and robustness attributes

Journal of Parallel and Distributed Computing

Volumn 65, Issue 11, 2005, Pages 1443-1452

  Parhami, Behrooz ^a,b,c,d,e  

^a University of California   (United States)

^b IEEE   (United States)

^c British Computer Society ^*  (United Kingdom)

^d Association for Computing Machniery   (United States)

^e Informatics Society of Iran   (Iran)

Author keywords

Average internode distance; Bisection width; Fault diameter; Fault tolerance; Interconnection network; Modularity; OTIS network; Packageability; Robustness; Survivability

Indexed keywords

AVERAGE INTERMODE DISTANCE; BISECTION WIDTH; FAULT DIAMETER; MODULARITY; PACKAGEABILITY; SURVIVABILITY;

FAULT TOLERANT COMPUTER SYSTEMS; HAMILTONIANS; ROBUSTNESS (CONTROL SYSTEMS); TOPOLOGY;

INTERCONNECTION NETWORKS;

EID: 26944467146     PISSN: 07437315     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpdc.2005.05.002     Document Type: Article

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