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Volumn 8, Issue 9-10 SPEC. ISS., 2005, Pages 1461-1468
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A new strategy to model the Si(100) surface
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Author keywords
AM1; Cluster; DFT; ONIOM; Silicon
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Indexed keywords
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EID: 26944433052
PISSN: 16310748
EISSN: None
Source Type: Journal
DOI: 10.1016/j.crci.2004.10.033 Document Type: Article |
Times cited : (10)
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References (33)
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