Electrochemical investigation of the stability and corrosion resistance of Boron Phosphide films prepared by PECVD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5786, Issue , 2005, Pages 365-372

  Ogwu, Abraham ^a   Hellwig, Thomas ^a   Doherty, Saul ^b   Haddow, David ^b   Möllmann, Klaus Peter ^c   Placido, Francis ^a  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

^b Laser Solutions Unit   (France)

^c BRANDENBURG UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; COMPOSITION; CORROSION RESISTANCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; STAINLESS STEEL; SYSTEM STABILITY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BORON PHOSPHIDE; CORROSION RATES; CORROSION SUSCEPTIBILITY; SALINE SOLUTIONS;

ELECTROCHEMISTRY;

EID: 26844571393     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603337     Document Type: Conference Paper

References (4)

1. D. Haddow, A.A. Ogwu and F.Placido, Corrosion resistance potential of Boron Phosphide films in a Naval Environment, SPIE Aerosense conference, Orlando, Florida, USA, April 2003, Window and Dome Technologies VIII, R.W. Tustison, Editor, Proceedings of SPIE, Vol.5078, 2003, P109-120
2. F. Mansfield, Electrochimica Acta, Vol.35, No.10, 1990, P1533-1544.
3. G.W. Walter, Corrosion Science, Vol.26, No.9, 1986, P681-703
4. A.A. Ogwu, T. Hellwig, S. Doherty, D. Haddow, K. Moellman and F. Placido, Surface characterisation and surface energy measurements on Boron Phosphide films prepared by PECVD. SPIE Defence & Security Symposium; Window and Dome Technologies and Materials IX, Orlando, Florida, USA, 28 March-1 April 2005. Proceedings of SPIE, Vol. 5786, 2005.