Surface characterisation and surface energy measurements on Boron phosphide films prepared by PECVD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5786, Issue , 2005, Pages 130-136

  Ogwu, Abraham ^a   Hellwig, Thomas ^a   Doherty, Saul ^b   Haddow, David ^b   Möllmann, Klaus Peter ^c   Placido, Frank ^a  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

^b Laser Solutions Unit   (France)

^c BRANDENBURG UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORON COMPOUNDS; INTERFACIAL ENERGY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PROTECTIVE COATINGS; SCANNING ELECTRON MICROSCOPY; TRIBOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY;

BORON PHOSPHIDE FILMS; NANO-INDENTATION; SURFACE CHARACTERIZATION; VAN-OSS-CHAUDHARY-GOOD (VOCG) METHOD;

THIN FILMS;

EID: 26844573918     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603327     Document Type: Conference Paper

References (5)

1. B.C. Monachan, D.Morrison, E.M. Waddell, D.R. Gibson, A.D. Wilson and K.L. Lewis, Critical Reviews of Optical science, Vol. CR39, Ed. Ric P. Shimshock, SPIE, 1992, P91-123.
2. F.M. Fowkes, J. Adhesion 4 (1972) P155-167
3. P.H. Owens and R.C. Wendt, J. Appl.poym.sci. 13 (1969) P1741-1747
4. C.J. Van Oss, R.J. Good and M.K. Chaudhry, J. Colloid Surface Sci III, (1986), P378-390
5. J. McLaughlin, P.Maguire, A.Ogwu, R.Lamberton, J.F. Zhao and P.Lemoine, International Journal of Modern Physics B, Vol.14, Nos 2&3, (2000) P167-180