Nondestructive method for the characterization of ion-implanted waveguides

Optics Letters

Volumn 30, Issue 18, 2005, Pages 2412-2414

  Guarino, Andrea ^a   Günter, Peter ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ION-IMPLANTED WAVEGUIDES; NON-INCOUPLED REFLECTED LIGHT; PRISM COUPLING;

ION IMPLANTATION; NONDESTRUCTIVE EXAMINATION; POTASSIUM COMPOUNDS; PRISMS; REFRACTIVE INDEX;

OPTICAL WAVEGUIDES;

EID: 26844536085     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.002412     Document Type: Article

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