A new quantitative method for analysing unreplicated factorial designs

Biometrical Journal

Volumn 46, Issue 1, 2004, Pages 125-140

  Chen, Ying ^a   Kunert, Joachim ^b  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b TU DORTMUND UNIVERSITY   (Germany)

Author keywords

Half normal plot; Loss of decision; Quantitative methods; Simulation study; Unreplicated factorial

Indexed keywords

STATISTICS;

ACTIVE CONTRASTS; ERROR VARIANCE; HALF-NORMAL PLOTS; LOSS OF DECISION; PERFORMANCE; QUANTITATIVE METHOD; SIMULATION STUDIES; TEST STATISTICS; UNREPLICATED FACTORIAL; UNREPLICATED FACTORIAL DESIGN;

STATISTICAL TESTS;

EID: 26844520758     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200210005     Document Type: Article

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