High precision metrology of domes and aspheric optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5786, Issue , 2005, Pages 112-121

  Murphy, Paul E ^a   Fleig, Jon ^a   Forbes, Greg ^a   Tricard, Marc ^a  

^a QED TECHNOLOGIES   (United States)

Author keywords

Aspheric optics; Domes; Interferometry; Metrology; SSI; Subaperture stitching

Indexed keywords

ASPHERICS; COMPUTER SOFTWARE; DATA ACQUISITION; DOMES; INTERFEROMETERS; MEASUREMENT THEORY; MILITARY APPLICATIONS; PHASE SHIFT;

ASPHERIC DOMES; ASPHERICS DOMES; DEFENSE SYSTEMS; SSI; SUBAPERTURE STITCHING INTERFEROMETERS (SSI);

OPTICAL ENGINEERING;

EID: 26844473439     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.607457     Document Type: Conference Paper

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