Stitching Interferometry: A Flexible Solution for Surface Metrology

Optics and Photonics News

Volumn 14, Issue 5, 2003, Pages 38-43

  Murphy, Paul ^a   Forbes, Greg ^a   Fleig, Jon ^a   Dumas, Paul ^a   Tricard, Marc ^a  

^a QED TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALIBRATION; INTERFEROMETERS;

SUBAPERTURE STITCHING;

OPTICAL SYSTEMS;

EID: 0141868831     PISSN: 10476938     EISSN: None     Source Type: Trade Journal    
DOI: 10.1364/OPN.14.5.000038     Document Type: Article

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4. Tronolone et al., "Method of testing aspherical optical surfaces with an interferometer," U.S. Patent #5,416,586; Tropel Corporation.
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6. M. Bray, Proc. SPIE. 3134, 39-50, 1997.
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10. G.W. Forbes, P. R. Dumas, J. F. Fleig and P. E. Murphy, "Subaperture stitching interferometer for versatile and accurate surface metrology," Optical Fabrication and Testing Technical Digest June 2002.
11. Schneider Opticmachines, http://www.schneiderom.com