Magnetic refinement of tips for magnetic force microscopy

Scanning

Volumn 18, Issue 5, 1996, Pages 374-378

  Bauer, P ^a   Bochem, H P ^a   Leinenbach, P ^a   Memmert, U ^a   Schelten, J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Magnetism; Nanometer lithography; Scanning (magnetic) force microscopy

Indexed keywords

ARTICLE; DYNAMICS; IMAGE PROCESSING; IMAGE QUALITY; MAGNETIC FIELD; PRIORITY JOURNAL; SCANNING FORCE MICROSCOPY;

EID: 0030317238     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1996.4950180508     Document Type: Article

References (8)

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