Accurate ARL computation for EWMA-S 2 control charts

Statistics and Computing

Volumn 15, Issue 4, 2005, Pages 341-352

  Knoth, Sven ^a  

^a Advanced Mask Technology Center   (Germany)

Author keywords

Collocation; Control charts; Fredholm integral equations; Monitoring variance; Product Nystr m method

Indexed keywords

EID: 26644456730     PISSN: 09603174     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11222-005-3393-z     Document Type: Article

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