Computing average run lengths of exponential EWMA charts

Journal of Quality Technology

Volumn 32, Issue 2, 2000, Pages 183-187

  Gan, F F ^a,c   Chang, T C ^b,c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Siemens Components   (Malaysia)

^c Dept of Stat and Appl Probability ^*

Author keywords

Average Run Length; Exponential Distribution; Poisson Distribution; Statistical Process Control

Indexed keywords

EID: 0011108232     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2000.11979989     Document Type: Article

References (11)

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6. GAN, F. F. (1998). "Designs of One- and Two-Sided Exponential EWMA Charts". Journal of Quality Technology 30, pp. 55-69.
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11. VARDEMAN, S. and RAY D. (1985). "Average Run Lengths for CUSUM Schemes When Observations are Exponentially Distributed". Technometrics 27, pp. 145-150.