Fingerprint matching using the distribution of the pairwise distances between minutiae

Lecture Notes in Computer Science

Volumn 3546, Issue , 2005, Pages 693-701

  Park, Chul Hyun ^a   Smith, Mark J T ^a   Boutin, Mireille ^a   Lee, Joon Jae ^b  

^a PURDUE UNIVERSITY   (United States)

^b Dongseo University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATABASE SYSTEMS; RANDOM PROCESSES; SMART CARDS;

EUCLIDEAN DISTANCE; FINGERPRINT MATCHING ALGORITHM; FINGERPRINT REPRESENTATION; MINUTIAE MATCHING METHODS;

PATTERN MATCHING;

EID: 26444617551     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11527923_72     Document Type: Conference Paper

References (9)

1. Maltoni, D., Maio, D., Jain, A.K., Prabhakar, S.: Handbook of fingerprint recognition. Springer-Verlag (2003)
2. Huvavandana, S., Kim, C., Hwang, J.N.: Reliable and fast fingerprint identification security applications. Proc. Int. Conf. on Image Processing 2 (2000) 503-506
3. Ratha, N.K., Karu, K., Chen, S., Jain, A.K.: A real-time matching system for large fingerprint databases. IEEE Trans. PAMI 18(8) (1996) 799-813
4. Udupa, R., Garg, G., Sharma, P.: Fast and accurate fingerprint verification. Proc. Int. Conf. on Audio- and Video-Based Person Authentication (3rd) (2001) 192-197
5. Boutin, M., Kemper, G.: Which point configurations are determined by the distribution of their pairwise distances. Submitted to Int. J. Comp. Geom. and Appl. (2004)
6. Boutin, M., Kemper, G.: On reconstructing n-point configurations from the distribution of distances or areas. Adv. Appl. Math. 32(2004) 709-735
7. Jain, A.K., Pankanti, S., Prabhakar, S., Hong, L., Ross, A., Wayman, J.L.: Biometrics: A grand challenge. Proc. Int. Conf. on Pattern Recognition, Cambridge, UK, 2 (Aug. 2004) 935-942
8. Karu, K., Jain, A. K.: Fingerprint classification. Pattern Recognition. 29 (3) (1996) 389-404
9. Maio, D., Maltoni, D., Cappelli, R., Wayman, J.L., Jain, A.K.: FVC2000: Fingerprint verification competition, IEEE Trans. Pattern Anal. Mach. Intell. 24 (3) (2002) 402-411