Electron radiation damage in Cu(In,Ga)Se 2 analysed in-situ by cathodoluminescence in a transmission electron microscope

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 12, 2005, Pages 2336-2343

  Scheel, Hanne ^a   Frank, Gerhard ^a   Strunk, Horst P ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT FORMATION KINETICS; ELECTRON RADIATION DAMAGE; VOLTAGE DEPENDENCE;

ANNEALING; CATHODOLUMINESCENCE; COPPER COMPOUNDS; ELECTRIC POTENTIAL; RADIATION DAMAGE; REACTION KINETICS; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

THIN FILMS;

EID: 26444532324     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200521172     Document Type: Article

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