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Volumn 7, Issue 4, 2003, Pages 525-533
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Measured and calculated stark parameters for several Ar I spectral lines
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Author keywords
Atomic data; Line: profiles; Plasmas
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Indexed keywords
ARGON;
CARRIER CONCENTRATION;
HELIUM;
PARAMETER ESTIMATION;
PLASMAS;
SPECTRUM ANALYSIS;
THERMAL EFFECTS;
ATOMIC DATA;
ELECTRON TEMPERATURE;
LINE:PROFILES;
MATERIALS SCIENCE;
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EID: 2642558805
PISSN: 10933611
EISSN: None
Source Type: Journal
DOI: 10.1615/hightempmatproc.v7.i4.70 Document Type: Conference Paper |
Times cited : (4)
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References (30)
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