Electron backscattered diffraction characterization technique for analysis of a Ti2AlNb intermetallic alloy

Journal of Microscopy

Volumn 219, Issue 3, 2005, Pages 115-121

  Wynick, G L ^a   Boehlert, Carl J ^b  

^a Alfred University   (United States)

^b Michigan State University   (United States)

Author keywords

Electron backscatter diffraction; Microstructure; Titanium alloy

Indexed keywords

ALUMINA; ALUMINUM ALLOYS; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; DIFFRACTION PATTERNS; ELECTROLYTIC POLISHING; ELECTRON DIFFRACTION; ELECTRONS; INTERFEROMETRY; INTERMETALLICS; NANOTECHNOLOGY; NIOBIUM ALLOYS; SILICA; SURFACE ROUGHNESS; TITANIUM ALLOYS;

BODY-CENTERED-CUBIC PHASE; BODY-CENTRED CUBIC; CHARACTERIZATION TECHNIQUES; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACK-SCATTERED DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; INTERMETALLIC ALLOYS; MECHANICAL POLISHING; PATTERN QUALITY; TITANIUM (ALLOYS);

MICROSTRUCTURE;

ALLOY; ALUMINUM; ALUMINUM OXIDE; ELECTROLYTE; METHANOL; NANOPARTICLE; NIOBIUM; SILICON DIOXIDE; SULFURIC ACID; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; ELECTROPOLISHING; PRIORITY JOURNAL; STATISTICAL ANALYSIS; SURFACE PROPERTY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 26244439853     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01499.x     Document Type: Article

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