|
Volumn 2, Issue 7, 2005, Pages 2191-2194
|
Role of initial nucleation in molecular-beam epitaxy of GaN on lattice-matched ZrB2 substrates
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
CRYSTAL MICROSTRUCTURE;
HIGH TEMPERATURE EFFECTS;
LOW TEMPERATURE EFFECTS;
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
NITROGEN;
NUCLEATION;
OPTIMIZATION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SUBSTRATES;
X RAY ANALYSIS;
ZIRCONIUM COMPOUNDS;
HIGH-TEMPERATURE GROWTH;
NUCLEATION LAYERS;
SUB-GRAIN STRUCTURE;
X-RAY CHARACTERISTICS;
GALLIUM NITRIDE;
|
EID: 26044454173
PISSN: 16101634
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1002/pssc.200461539 Document Type: Conference Paper |
Times cited : (6)
|
References (6)
|